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분야 | ISO/TC 85/SC 2 : Radiological protection |
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적용범위 | This document specifies the characteristics of reference measurement standards of radioactive surface contamination, traceable to national measurement standards, for the calibration of surface contamination monitors. This document relates to alpha-emitters, beta-emitters, and photon emitters of maximum photon energy not greater than 1,5 MeV. It does not describe the procedures involved in the use of these reference measurement standards for the calibration of surface contamination monitors. Such procedures are specified in IEC 60325[6], IEC 62363[7], and other documents. NOTE Since some of the proposed photon standards include filters, the photon standards are to be regarded as reference measurement standards of photons of a particular energy range and not as reference measurement standards of a particular radionuclide. For example, a 241Am source with the recommended filtration does not emit from the surface the alpha particles or characteristic low-energy L X-ray photons associated with the decay of the nuclide. It is designed to be a reference measurement standard that emits photons with an average energy of approximately 60 keV. This document also specifies preferred reference radiations for the calibration of surface contamination monitors. These reference radiations are realized in the form of adequately characterized large area sources specified, without exception, in terms of surface emission rate and activity which are traceable to national standards. |
국제분류(ICS)코드 | 17.240 : 방사능 측정 |
페이지수 | 13 |
Edition | 4 |
No. | 표준번호 | 표준명 | 발행일 | 상태 |
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1 | ISO 8769:2020 | Measurement of radioactivity — Alpha-, beta- and photon emitting radionuclides — Reference measurement standard specifications for the calibration of surface contamination monitors | 2020-06-22 | 표준 |
2 | ISO 8769:2016 | Reference sources — Calibration of surface contamination monitors — Alpha-, beta- and photon emitters | 2016-01-04 | 구판 |
3 | ISO 8769:2010 | Reference sources — Calibration of surface contamination monitors — Alpha-, beta- and photon emitters | 2010-09-03 | 구판 |
4 | ISO 8769:1988 | Reference sources for the calibration of surface contamination monitors — Beta-emitters (maximum beta energy greater than 0,15 MeV) and alpha-emitters | 1988-06-23 | 구판 |
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