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분야 | TC 47 : Semiconductor devices |
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적용범위 | IEC 60747-1:2006+A1:2010 gives the general requirements applicable to the discrete semiconductor devices and integrated circuits covered by the other parts of IEC 60747 and IEC 60748 (see Annex A). This consolidated version consists of the second edition (2006) and its amendment 1 (2010). Therefore, no need to order amendment in addition to this publication. |
국제분류(ICS)코드 | 31.080.01 : 반도체 장치 일반 |
페이지수 | 91 |
Edition | 2.1 |
No. | 표준번호 | 표준명 | 발행일 | 상태 |
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1 | IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General | 2010-08-23 | 표준 |
2 | IEC 60747-1:2006/AMD1:2010 | Amendment 1 - Semiconductor devices - Part 1: General | 2010-05-19 | 표준 |
3 | IEC 60747-1:2006/COR1:2008 | Corrigendum 1 - Semiconductor devices - Part 1: General | 2008-09-08 | 표준 |
4 | IEC 60747-1:2006 | Semiconductor devices - Part 1: General | 2006-02-21 | 표준 |
5 | IEC 60747-1:1983/AMD3:1996 | Amendment 3 - Semiconductor devices - Discrete devices - Part 1: General | 1996-09-26 | 구판 |
6 | IEC 60747-1:1983/AMD2:1993 | Amendment 2 - Semiconductor devices - Discrete devices and integrated circuits - Part 1: General | 1993-10-01 | 구판 |
7 | IEC 60747-1:1983/AMD1:1991 | Amendment 1 - Semiconductor devices - Discrete devices and integrated circuits - Part 1: General | 1991-09-01 | 구판 |
8 | IEC 60747-1:1983 | Semiconductor devices - Discrete devices - Part 1: General | 1983-01-01 | 구판 |
IEC 60747-11:1985 - Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices 상세보기
IEC 60747-3-1:1986 - Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section One: Blank detail specification for signal diodes, switching diodes and controlled-avalanche diodes 상세보기
IEC 60747-3-2:1986 - Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section Two: Blank detail specification for voltage-regulator diodes and voltage-reference diodes,excluding temperature-compensated precision reference diodes 상세보기
IEC 60747-8-1:1987 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section One: Blank detail specification for single-gate field-effect transistors up to 5 W and 1 GHz 상세보기
IEC 60747-7-1:1989 - Semiconductor devices - Discrete devices - Part 7: Bipolar transistors - Section One: Blank detail specification for ambient-rated bipolar transistors for low and high-frequency amplification 상세보기
IEC 61660-1:1997/COR2:2000 - Corrigendum 2 - Short-circuit currents in d.c. auxiliary installations in power plants and substations - Part 1: Calculation of short-circuit currents 상세보기
IEC 61660-1:1997/COR1:1999 - Corrigendum 1 - Short-circuit currents in d.c. auxiliary installations in power plants and substations - Part 1: Calculation of short-circuit currents 상세보기
IEC 61660-1:1997 - Short-circuit currents in d.c. auxiliary installations in power plants and substations - Part 1: Calculation of short-circuit currents 상세보기
IEC 61000-3-12:2011+AMD1:2021 CSV - Electromagnetic compatibility (EMC) - Part 3-12: Limits - Limits for harmonic currents produced by equipment connected to public low-voltage systems with input current >16 A and ≤ 75 A per phase 상세보기
IEC 61851-21-2:2018 - Electric vehicle conductive charging system - Part 21-2: Electric vehicle requirements for conductive connection to an AC/DC supply - EMC requirements for off board electric vehicle charging systems 상세보기
IEC TS 63134:2020 - Active assisted living (AAL) use cases 상세보기
IEC 60034-5:2020 RLV - Rotating electrical machines - Part 5: Degrees of protection provided by the integral design of rotating electrical machines (IP code) - Classification 상세보기
KS B ISO TS 25740-1 - 에스컬레이터 및 무빙워크에 대한 안전요건 — 제1부: 세계공통 필수 안전요건(GESRs) 상세보기
KS B ISO TS 8100-21 - 승객 및 화물 운송용 엘리베이터 —제21부: 세계공통 필수안전요건(GESRs)을 충족하는 세계공통 안전 파라미터(GSPs) 상세보기
KS C IEC TS 62872 - 산업 시설과 스마트 그리드 사이의 산업 공정 측정, 제어 및 자동화 시스템 인터페이스 상세보기