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Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
| 분야 | TC 47/SC 47E : Discrete semiconductor devices |
|---|---|
| 적용범위 | IEC 60747-2:2016 provides standards for the following categories or sub-categories of rectifier diodes, including: - line rectifier diodes; - avalanche rectifier diodes; - fast-switching rectifier diodes; - Schottky barrier diodes. This edition includes the following significant technical changes with respect to the previous edition: a) Schottky barrier diodes and its properties are added; b) Clauses 3, 4, 5 and 7 were amended with some deletions of information no longer in use or already included in other parts of the IEC 60747 series, and with some necessary additions; c) Clause 6 was moved and added to Clause 7 of this third edition; d) some parts of Clause 7 were moved and added to Clause 7 of this third edition; e) Annex A was deleted. This publication is to be read in conjunction with IEC 60747-1:2006. |
| 국제분류(ICS)코드 | 31.080.10 : 다이오우드 |
| 페이지수 | 91 |
| Edition | 3.0 |
| No. | 표준번호 | 표준명 | 발행일 | 상태 |
|---|---|---|---|---|
| 1 | IEC 60747-2:2016 | Semiconductor devices - Part 2: Discrete devices - Rectifier diodes | 2016-04-13 | 표준 |
| 2 | IEC 60747-2:2000 | Semiconductor devices - Discrete devices and integrated circuits - Part 2: Rectifier diodes | 2000-03-21 | 구판 |
| 3 | IEC 60747-2:1983/AMD2:1993 | Amendment 2 - Semiconductor devices - Discrete devices - Part 2: Rectifier diodes | 1993-10-08 | 구판 |
| 4 | IEC 60747-2:1983/AMD1:1992 | Amendment 1 - Semiconductor devices - Discrete devices - Part 2: Rectifier diodes | 1992-02-29 | 구판 |
| 5 | IEC 60747-2:1983 | Semiconductor devices - Discrete devices - Part 2: Rectifier diodes | 1983-01-01 | 구판 |
IEC 60747-11:1985 - Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices 상세보기
IEC 60747-3-1:1986 - Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section One: Blank detail specification for signal diodes, switching diodes and controlled-avalanche diodes 상세보기
IEC 60747-3-2:1986 - Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section Two: Blank detail specification for voltage-regulator diodes and voltage-reference diodes,excluding temperature-compensated precision reference diodes 상세보기
IEC 60747-8-1:1987 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section One: Blank detail specification for single-gate field-effect transistors up to 5 W and 1 GHz 상세보기
IEC 60747-7-1:1989 - Semiconductor devices - Discrete devices - Part 7: Bipolar transistors - Section One: Blank detail specification for ambient-rated bipolar transistors for low and high-frequency amplification 상세보기
IEC 60747-15:2010 - Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices 상세보기
IEC 60749-34:2010 - Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling 상세보기
IEC 60068-2-27:2008 - Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock 상세보기
IEC 60068-2-6:2007 - Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal) 상세보기
IEC 60664-4:2005 - Insulation coordination for equipment within low-voltage systems - Part 4: Consideration of high-frequency voltage stress 상세보기
IEC TS 63134:2020 - Active assisted living (AAL) use cases 상세보기
IEC 60034-5:2020 RLV - Rotating electrical machines - Part 5: Degrees of protection provided by the integral design of rotating electrical machines (IP code) - Classification 상세보기
KS B ISO TS 25740-1 - 에스컬레이터 및 무빙워크에 대한 안전요건 — 제1부: 세계공통 필수 안전요건(GESRs) 상세보기
KS B ISO TS 8100-21 - 승객 및 화물 운송용 엘리베이터 —제21부: 세계공통 필수안전요건(GESRs)을 충족하는 세계공통 안전 파라미터(GSPs) 상세보기
KS C IEC TS 62872 - 산업 시설과 스마트 그리드 사이의 산업 공정 측정, 제어 및 자동화 시스템 인터페이스 상세보기
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