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분야 | TC 47/SC 47E : Discrete semiconductor devices |
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적용범위 | IEC 60747-15:2010 gives the requirements for isolated power semiconductor devices excluding devices with incorporated control circuits. These requirements are additional to those given in other parts of IEC 60747 for the corresponding non-isolated power devices. The main changes with respect to previous edition are listed below. a) Clause 3, 4 and 5 were re-edited and some of them were combined to other sub clauses. b) Clause 6, 7 were re-edited as a part of "Measuring methods" with amendment of suitable addition and deletion. c) Clause 8 was amended by suitable addition and deletion. d) Annex C, D and Bibliography were deleted. This publication is to be read in conjunction with IEC 60747-1:2006. |
국제분류(ICS)코드 | 31.080.99 : 기타 반도체 장치 |
페이지수 | 49 |
Edition | 2.0 |
No. | 표준번호 | 표준명 | 발행일 | 상태 |
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1 | IEC 60747-15:2024 | Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices | 2024-10-22 | 표준 |
2 | IEC 60747-15:2024 RLV | Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices | 2024-10-22 | 표준 |
3 | IEC 60747-15:2010 | Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices | 2010-12-16 | 구판 |
4 | IEC 60747-15:2003 | Discrete semiconductor devices - Part 15: Isolated power semiconductor devices | 2003-06-11 | 구판 |
IEC 60747-11:1985 - Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices 상세보기
IEC 60747-3-1:1986 - Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section One: Blank detail specification for signal diodes, switching diodes and controlled-avalanche diodes 상세보기
IEC 60747-3-2:1986 - Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section Two: Blank detail specification for voltage-regulator diodes and voltage-reference diodes,excluding temperature-compensated precision reference diodes 상세보기
IEC 60747-8-1:1987 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section One: Blank detail specification for single-gate field-effect transistors up to 5 W and 1 GHz 상세보기
IEC 60747-7-1:1989 - Semiconductor devices - Discrete devices - Part 7: Bipolar transistors - Section One: Blank detail specification for ambient-rated bipolar transistors for low and high-frequency amplification 상세보기
IEC 60747-2:2016 - Semiconductor devices - Part 2: Discrete devices - Rectifier diodes 상세보기
IEC 60664-1:2020 - Insulation coordination for equipment within low-voltage supply systems - Part 1: Principles, requirements and tests 상세보기
IEC 60664-4:2005 - Insulation coordination for equipment within low-voltage systems - Part 4: Consideration of high-frequency voltage stress 상세보기
IEC 60068-2-27:2008 - Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock 상세보기
ASTM B1005-17 - Standard Specification for Copper-Clad Aluminum Bar for Electrical Purposes (Bus Bar) 상세보기
IEC TS 63134:2020 - Active assisted living (AAL) use cases 상세보기
IEC 60034-5:2020 RLV - Rotating electrical machines - Part 5: Degrees of protection provided by the integral design of rotating electrical machines (IP code) - Classification 상세보기
KS B ISO TS 25740-1 - 에스컬레이터 및 무빙워크에 대한 안전요건 — 제1부: 세계공통 필수 안전요건(GESRs) 상세보기
KS B ISO TS 8100-21 - 승객 및 화물 운송용 엘리베이터 —제21부: 세계공통 필수안전요건(GESRs)을 충족하는 세계공통 안전 파라미터(GSPs) 상세보기
KS C IEC TS 62872 - 산업 시설과 스마트 그리드 사이의 산업 공정 측정, 제어 및 자동화 시스템 인터페이스 상세보기