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Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
| 분야 | TC 47 : Semiconductor devices |
|---|---|
| 적용범위 | IEC 60749-5:2017 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) correction of an error in an equation; b) inclusion of notes for guidance; c) clarification of the applicability of test conditions. |
| 국제분류(ICS)코드 | 31.080.01 : 반도체 장치 일반 |
| 페이지수 | 18 |
| Edition | 2.0 |
| No. | 표준번호 | 표준명 | 발행일 | 상태 |
|---|---|---|---|---|
| 1 | IEC 60749-5:2023 | Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test | 2023-12-19 | 표준 |
| 2 | IEC 60749-5:2023 RLV | Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test | 2023-12-19 | 표준 |
| 3 | IEC 60749-5:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test | 2017-04-10 | 구판 |
| 4 | IEC 60749-5:2003 | Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test | 2003-01-17 | 구판 |
IEC 60749-11:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method 상세보기
IEC 60749-2:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure 상세보기
IEC 60749-31:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced) 상세보기
IEC 60749-1:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General 상세보기
IEC 60749-8:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing 상세보기
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